LSI/VLSI Testability Design - Frank F. Tsui - książka wyd. 1988

Opis

“LSI/VLSI Testability Design” is a technical book that focuses on methods for improving the testing and reliability of large-scale and very-large-scale integrated circuits. It explains design techniques that make complex electronic systems easier to test during manufacturing and operation. The book discusses topics such as fault detection, test generation, and design-for-testability strategies used in modern microelectronics. It is intended for engineers, researchers, and students working in integrated circuit design and electronic engineering.